PSYCHOLOGICAL TESTING (Record no. 223273)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00411nam a2200181Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 210301b xxu||||| |||| 00| 0 eng d |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 310/FRE |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | FREEMAN |
| 245 ## - TITLE STATEMENT | |
| Title | PSYCHOLOGICAL TESTING |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 3 |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | OXFORD & IBH, 1962. |
| Name of publisher, distributor, etc. | |
| Date of publication, distribution, etc. | |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 697 |
| 490 ## - SERIES STATEMENT | |
| Series statement | N |
| 500 ## - GENERAL NOTE | |
| General note | B.TECH |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | MRU |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | ELECTRONICS |
| 690 ## - LOCAL SUBJECT ADDED ENTRY--TOPICAL TERM (OCLC, RLIN) | |
| Topical term or geographic name as entry element | FACULTY OF ELECTRONICS SCIENCE |
| 905 ## - LOCAL DATA ELEMENT E, LDE (RLIN) | |
| a | Books |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | MRU |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) | |
| a | 69136 |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Total Checkouts | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Damaged | Manav Rachna University | Manav Rachna University | 07/03/2004 | 310/FRE | 4936 | Book |